DocumentCode
1534523
Title
Information obtained from the surface profile of a cut single-mode fiber
Author
Poumellec, B. ; Guénot ; Nadjo, R. ; Keita, B. ; Nicolardot, M.
Author_Institution
Thermodynamique et Phys.-Chimie des Mater., CNRS, Paris, France
Volume
17
Issue
8
fYear
1999
fDate
8/1/1999 12:00:00 AM
Firstpage
1357
Lastpage
1365
Abstract
This paper investigated the fiber-end surface modulation by atomic force microscopy (AFM) and optical profilometry after a careful cross cleavage with a diamond. The image of the surface allows to see the different parts of the fiber. The cladding appears above the mean level whereas the core appears depressed. This profile is tightly connected to the stress profile, itself induced by the doping field and the drawing conditions. Magnification of the core shows fluctuations of the glass structure at the scale of 25 nm with some of ≈80 nm. This method seems to be suitable to study fiber defects but is still difficult to perform due to the small size of the sample (φ=125 μm) and the dependence of the surface profile with the care to cleave the fiber. However, due to the better spatial resolution of the AFM measurements compared to the optical profilometry, itself larger than the one of photoelasticity measurements, it was possible to conclude that the axial stress exhibits a discontinuity at the core cladding interface and not a peak at the center of the core
Keywords
atomic force microscopy; drawing (mechanical); optical fibre cladding; optical fibre fabrication; optical fibre testing; surface topography measurement; 125 mum; AFM measurements; atomic force microscopy; axial stress; core cladding interface; cut single-mode fiber; discontinuity; doping field; drawing conditions; fiber defects; fiber-end surface modulation; fibre cladding; fluctuations; glass structure; magnification; optical profilometry; photoelasticity measurements; spatial resolution; stress profile; surface profile; Atom optics; Atomic force microscopy; Doping profiles; Fluctuations; Glass; Optical microscopy; Optical modulation; Photoelasticity; Spatial resolution; Stress measurement;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/50.779157
Filename
779157
Link To Document