Title :
Switch-level simulation and the pass transistor EXOR gate
Author :
Svensson, Christer ; Tjärnström, Robert
Author_Institution :
Dept. of Phys. & Meas. Technol., Linkoping Univ., Sweden
fDate :
9/1/1988 12:00:00 AM
Abstract :
The nonrestoring pass transistor EXOR gate is investigated by switch-level simulation. It is shown that the logical function of the EXOR gate depends on the driving conductance on the inputs to the gate. It is also shown why switch-level simulators are unsuccessful in simulating the pass transistor EXOR gate, and how a switch-level simulator can be designed to produce a correct simulation result
Keywords :
CMOS integrated circuits; circuit analysis computing; failure analysis; integrated logic circuits; logic CAD; logic gates; CMOSIC; PASOS; TMODS; driving conductance; failure analysis; logic gates; nonrestoring pass transistor; pass transistor EXOR gate; switch-level simulation; Circuit simulation; Driver circuits; Failure analysis; Helium; Inverters; Physics; SPICE; Switches;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on