Transverse Field-Induced Nucleation Pad Switching Modes During Domain Wall Injection

Author

Bryan, Matthew T. ; Fry, Paul W. ; Schrefl, Thomas ; Gibbs, Mike R J ; Allwood, Dan A. ; Im, Mi-Young ; Fischer, Peter

Author_Institution

Dept. of Eng. Mater., Univ. of Sheffield, Sheffield, UK

Volume

46

Issue

4

fYear

2010

fDate

4/1/2010 12:00:00 AM

Firstpage

963

Lastpage

967

Abstract

We have used magnetic transmission soft X-ray microscopy (M-TXM) to image in-field magnetization configurations of patterned Ni₈₀Fe₂₀ domain wall ??nucleation pads?? with attached planar nanowires. Comparison with micromagnetic simulations suggests that the evolution of magnetic domains in rectangular injection pads depends on the relative orientation of closure domains in the remanent state. The magnetization reversal pathway is altered by the inclusion of transverse magnetic fields. These different modes explain previous results of domain wall injection into nanowires.

Keywords

Permalloy; X-ray microscopy; magnetic domain walls; magnetisation reversal; micromagnetics; nanowires; Ni₈₀Fe₂₀; domain wall injection; in-field magnetization configurations; magnetic domains; magnetic transmission soft X-ray microscopy; magnetization reversal pathway; micromagnetic simulation; planar nanowires; rectangular injection pads; remanent state; transverse field-induced nucleation pad switching modes; transverse magnetic fields; Domain wall injection; nanowires; nucleation pad; switching modes; transverse field;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2009.2034848

Filename

5308245