DocumentCode
1535317
Title
Fault sampling revisited
Author
Agrawal, Vishwani D.
Author_Institution
AT&T Bell Lab., Murray Hill, NJ, USA
Volume
7
Issue
4
fYear
1990
Firstpage
32
Lastpage
35
Abstract
In the text, Test Generation for VLSI Chips (see IEEE Computer Society Press, 1988), V. Agrawal and S. Seth gave a formula for estimating fault coverage from the coverage analysis of randomly sampled faults that contains an error. A corrected formula for the sample size required for a given error tolerance in the measurement of fault coverage is given. Easy-to-use guidelines for analyzing fault coverage are presented.<>
Keywords
VLSI; fault location; integrated circuit testing; Test Generation; VLSI Chips; coverage analysis; error; fault coverage; randomly sampled faults; sample size; Circuit faults; Equations; Error correction; Fault detection; Fluctuations; Monte Carlo methods; Random number generation; Sampling methods; Testing; Very large scale integration;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.57911
Filename
57911
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