Title :
Recursive algorithm for calculating effective resistances in RC tree
Author :
Chang, Molin ; Yih, Shuih-Jong ; Feng, Wu-Shiung
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fDate :
1/16/1997 12:00:00 AM
Abstract :
Internal charges will affect the delay behaviour of a CMOS gate. To estimate each individual delay component due to charges stored in the different internal nodes, the effective resistance of each internal node is first computed. A recursive algorithm EER is proposed to solve this problem efficiently
Keywords :
CMOS logic circuits; RC circuits; delays; electric resistance; logic gates; recursive estimation; trees (mathematics); CMOS gate; EER recursive algorithm; RC tree; delay; effective resistance;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19970076
