• DocumentCode
    1535796
  • Title

    A 6.5-ns GaAs 20×20-b parallel multiplier with 67-ps gate delay

  • Author

    Singh, Hausila P. ; Burrier, Randall A. ; Sadler, Robert A.

  • Author_Institution
    ITT Gallium Arsenide Technol. Center, Roanoke, VA, USA
  • Volume
    25
  • Issue
    5
  • fYear
    1990
  • fDate
    10/1/1990 12:00:00 AM
  • Firstpage
    1226
  • Lastpage
    1231
  • Abstract
    The performance and yield of LSI circuits have been characterized over a wide variation in processing parameters and power supply voltage, and over the military temperature range using 4×4-, 8×8-, 12×12-, 16×16-, and 20×20-b multipliers. These parallel array multipliers with carry-save adder architecture have been implemented in low-power GaAs enhancement/depletion (E/D) direct-coupled FET logic (DCFL). The circuits were fabricated with a multifunction self-aligned gate process, which features a buried p-layer for high yield and manufacturability. Worst-case multiplication times ranging from 870 ps (51 ps/gate) for the 4×4-b, to 6.48 ns (67 ps/ gate) for the 20×20-b multiplier were obtained, with the fastest extracted gate delays yet reported for LSI circuits. The 20×20-b multiplier, with 18573 active devices (4902 logic gates), shows a wafer-probe yield as high as 61% on the best-yielding wafers. It is concluded that the E/D DCFL family is capable of providing LSI circuits operating over a wide variation in power-supply voltage and over the full military temperature range
  • Keywords
    III-V semiconductors; carry logic; field effect integrated circuits; gallium arsenide; large scale integration; logic arrays; multiplying circuits; 6.5 ns; 67 ps; GaAs; LSI circuits; buried p-layer; carry-save adder architecture; direct-coupled FET logic; low power enhancement/depletion DCFL; military temperature range; multifunction self-aligned gate process; parallel array multipliers; power supply voltage; processing parameters; Adders; Circuits; FETs; Gallium arsenide; Large scale integration; Logic arrays; Manufacturing processes; Power supplies; Temperature distribution; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.62146
  • Filename
    62146