Title :
Magnetoresistive read heads for high-density data applications
Author :
Cuntze, Georg ; Hughes, Timothy ; Magnusson, Steven ; Nichtl-Pecher, Wolfgang ; Norton, David ; Pechtold, Michael
Author_Institution :
Exabyte Magnetics GmbH, Nuremberg, Germany
fDate :
9/1/2001 12:00:00 AM
Abstract :
We present experimental results such as channel response, signal-to-noise ratio, bit-error rate, and wear of anisotropic magnetoresistive (AMR) helical scan read heads compared to respective values of inductive ferrite read heads. The presented measurements indicate the advantages of the AMR head
Keywords :
magnetic heads; magnetic recording noise; magnetic tape equipment; magnetoresistive devices; wear; anisotropic magnetoresistive heads; bit-error rate; channel response; helical scan read heads; high-density data applications; magnetoresistive read heads; noise response; signal-to-noise ratio; tape storage; wear; Anisotropic magnetoresistance; Azimuth; Bit error rate; Circuit testing; Ferrites; Magnetic force microscopy; Magnetic heads; Signal to noise ratio; System testing; Transducers;
Journal_Title :
Magnetics, IEEE Transactions on
