Title :
Diagnosis of scan cells in BIST environment
Author :
Rajski, Janusz ; Tyszer, Jerzy
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR, USA
fDate :
7/1/1999 12:00:00 AM
Abstract :
The paper presents a new fault diagnosis technique for scan-based designs with BIST. It can be used for nonadaptive identification of the scan cells that are driven by erroneous signals. The proposed scheme employs a pseudorandom scan cell selection routine which, in conjunction with a conventional signature analysis and simple reasoning procedure, allows flexible trade-offs between the test application time and the diagnostic resolution
Keywords :
built-in self test; design for testability; fault diagnosis; logic testing; BIST environment; diagnostic resolution; erroneous signals; fault diagnosis technique; nonadaptive identification; pseudorandom scan cell selection routine; reasoning procedure; scan cells diagnosis; Built-in self-test; Circuit faults; Circuit testing; Compaction; Failure analysis; Fault diagnosis; Flip-flops; Hardware; Logic devices; Logic testing;
Journal_Title :
Computers, IEEE Transactions on
