• DocumentCode
    1536399
  • Title

    Guest editors´ introduction: test trade-offs take center stage at ITC

  • Author

    Ambler, T. ; Wheater, D.

  • Author_Institution
    University of Texas at Austin
  • Volume
    18
  • Issue
    5
  • fYear
    2001
  • Firstpage
    59
  • Lastpage
    59
  • Abstract
    Presents the guest editorial for this issue of the publication.
  • Keywords
    Testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2001.953272
  • Filename
    953272
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1536399