Title :
Exploiting CMOS reverse interconnect scaling in multigigahertz amplifier and oscillator design
Author :
Kleveland, Bendik ; Diaz, Carlos H. ; Vook, Dieter ; Madden, Liam ; Lee, Thomas H. ; Wong, S. Simon
Author_Institution :
Stanford Univ., CA, USA
fDate :
10/1/2001 12:00:00 AM
Abstract :
The increasing number of interconnect layers that are needed in a CMOS process to meet the routing and power requirements of large digital circuits also yield significant advantages for analog applications. The reverse thickness scaling of the top metal layer can be exploited in the design of low-loss transmission lines. Coplanar transmission lines in the top metal layers take advantage of a low metal resistance and a large separation from the heavily doped silicon substrate. They are therefore fully compatible with current and future CMOS process technologies. To investigate the feasibility of extending CMOS designs beyond 10 GHz, a wide range of coplanar transmission lines are characterized. The effect of the substrate resistivity on coplanar wave propagation is explained. After achieving a record loss of 0.3 dB/mm at 50 GHz, coplanar lines are used in the design of distributed amplifiers and oscillators. They are the first to achieve higher than 10 GHz operating frequencies in a conventional CMOS technology
Keywords :
CMOS analogue integrated circuits; MMIC amplifiers; MMIC oscillators; coplanar transmission lines; coplanar waveguides; distributed amplifiers; distributed parameter networks; integrated circuit interconnections; integrated circuit layout; losses; travelling wave amplifiers; 10 GHz; 50 GHz; CMOS reverse interconnect scaling; SHF; Si; coplanar transmission lines; coplanar wave propagation; distributed amplifiers; distributed oscillators; heavily doped Si substrate; interconnect layers; low-loss transmission lines; multigigahertz amplifier design; multigigahertz oscillator design; reverse thickness scaling; substrate resistivity; top metal layer; CMOS process; CMOS technology; Conductivity; Coplanar transmission lines; Digital circuits; Distributed parameter circuits; Integrated circuit interconnections; Power transmission lines; Routing; Silicon;
Journal_Title :
Solid-State Circuits, IEEE Journal of