• DocumentCode
    1536847
  • Title

    The practical engineer-fine-tuning memory macros using variable internal delays

  • Author

    Gray, Ken

  • Author_Institution
    VLSI Technol. Inc., San Jose, CA, USA
  • Volume
    36
  • Issue
    8
  • fYear
    1999
  • fDate
    8/1/1999 12:00:00 AM
  • Firstpage
    44
  • Lastpage
    49
  • Abstract
    Embedded memory blocks are extremely common in application-specific IC (ASIC) chips. In this era of design reuse, it is critical that these memory macros, as they are also called, should be as versatile as possible. Their performance should be optimal, with adequate sense amplifier signal over the full manufacturing process range of the chip. Fortunately, several simple techniques exist for adapting memory macros to different applications running at different speeds. The key is to design in delays that are variable and/or programmable. The approach is also helpful in debugging initial hardware where a memory macro is refusing to function because its timing is too fast and there is insufficient internal delay for proper circuit operation. The techniques can also eliminate the process of redesigning and refabricating the initial hardware just to characterize it. A memory macro is made to function by internal pulses, generated in the correct number, sequence and relationship by the internal timing chain. The timing chain can be interlocked with the circuitry being driven by the addition to the macro of a set of circuits mimicking the operation of the primary circuitry
  • Keywords
    application specific integrated circuits; delays; embedded systems; macros; timing circuits; ASICs; embedded memory blocks; initial hardware debugging; internal timing chain; manufacturing process range; memory macros fine-tuning; optimal performance; sense amplifier signal; variable internal delays; Delay; Fault location; Logic circuits; Manufacturing processes; Probes; Pulse amplifiers; Pulse circuits; Pulse generation; Signal processing; Timing;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/6.780998
  • Filename
    780998