DocumentCode
1537202
Title
Control logic modelling scheme well suited to test problem
Author
Crestani, D. ; Chardon, P. ; Durante, C.
Author_Institution
Lab. d´Autom. et de Microelectron., Montpellier II Univ., France
Volume
27
Issue
11
fYear
1991
fDate
5/23/1991 12:00:00 AM
Firstpage
991
Lastpage
993
Abstract
Each VLSI circuit includes some blocks used to convert data, to give the microprocessor commands, and some programmable logic array blocks. These blocks are called random logic blocks. To propagate the test data through these random logic blocks, combinatorial or synchronous sequential, explicit knowledge is required of the input/output combinations that can be generated functionally. The usual representations of the random logic are unsuitable for this because they have not been designed for this purpose. A new model has been developed to obtain this knowledge. It clarifies all the possible input/output combinations, and it allows direct simulations and inferences through all kinds of random logic blocks.
Keywords
VLSI; logic arrays; logic design; logic testing; VLSI circuit; control logic; direct simulations; explicit knowledge; inferences; input/output combinations; logic modelling scheme; programmable logic array blocks; random logic blocks; test problem;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19910618
Filename
78133
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