Title :
Control logic modelling scheme well suited to test problem
Author :
Crestani, D. ; Chardon, P. ; Durante, C.
Author_Institution :
Lab. d´Autom. et de Microelectron., Montpellier II Univ., France
fDate :
5/23/1991 12:00:00 AM
Abstract :
Each VLSI circuit includes some blocks used to convert data, to give the microprocessor commands, and some programmable logic array blocks. These blocks are called random logic blocks. To propagate the test data through these random logic blocks, combinatorial or synchronous sequential, explicit knowledge is required of the input/output combinations that can be generated functionally. The usual representations of the random logic are unsuitable for this because they have not been designed for this purpose. A new model has been developed to obtain this knowledge. It clarifies all the possible input/output combinations, and it allows direct simulations and inferences through all kinds of random logic blocks.
Keywords :
VLSI; logic arrays; logic design; logic testing; VLSI circuit; control logic; direct simulations; explicit knowledge; inferences; input/output combinations; logic modelling scheme; programmable logic array blocks; random logic blocks; test problem;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19910618