DocumentCode :
1537461
Title :
The chemistry of interfacial tracking
Author :
Bolliger, Dominique A. ; Boggs, Steven A.
Author_Institution :
Inst. of Mater. Sci., Univ. of Connecticut, Storrs, CT, USA
Volume :
19
Issue :
3
fYear :
2012
fDate :
6/1/2012 12:00:00 AM
Firstpage :
996
Lastpage :
1006
Abstract :
Interfacial tracking occurs in a wide range of high voltage apparatus and frequently leads to electrical breakdown. A review of the chemistry of interfacial tracking along interfaces consisting of crosslinked polyethylene (XLPE), ethylene-propylene rubber (EPR) cable compound, and silicone rubber (SR) termination compound is given. Interfacial tracking experiments were conducted on the interfaces commonly encountered in cable accessories, including XLPE/EPR, XLPE/SR, EPR/EPR, and EPR/SR. The tracking products were analyzed using FTIR and GCMS. XLPE and EPR showed carbonization and an increase in cyclic and smaller chain hydrocarbons produced from radicals originating from hydrogen abstraction and chain scission. Oxidation of XLPE was observed with evidence of a Norrish type II photochemical reaction. SR showed evidence of SiO2 production along with lower molecular weight silicones. Tracking across an interface containing SR resulted in erosion of the SR side of the interface.
Keywords :
Fourier transform spectroscopy; XLPE insulation; cable jointing; electric breakdown; electric connectors; infrared spectroscopy; silicone rubber; surface chemistry; surface discharges; FTIR; GCMS; XLPE; cable accessory; chain scission; crosslinked polyethylene; electrical breakdown; ethylene-propylene rubber cable; high voltage apparatus; hydrogen abstraction; interfacial tracking; silicone rubber termination; Chemistry; Compounds; Degradation; Insulation life; Plastics; Strontium; Surface discharges; Interfacial tracking; cable accessories; crosslinked polyethylene insulation; ethylene-propylene rubber; gas chromatography; infrared spectroscopy; silicone rubber;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2012.6215105
Filename :
6215105
Link To Document :
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