Title :
Insulation characteristics of 1100 kV GIS under very fast transient overvoltage and lightning impulse
Author :
Zhang, Lu ; Zhang, Qiaogen ; Liu, Shi ; Liu, Fenglian ; Li, Long ; Yin, Yu ; Shi, Weidong ; Chen, Weijiang
Author_Institution :
Sch. of Electr. Eng., Xi´´an Jiaotong Univ., Xi´´an, China
fDate :
6/1/2012 12:00:00 AM
Abstract :
Very fast transient overvoltage (VFTO) in gas insulated switchgear (GIS) is of great concern at the higher rated voltages because the difference between the rated lightning impulse (LI) and the VFTO withstand voltage decreases. In order to clarify VFTO withstand level of 1100 kV GIS, a simulation system was designed for generation of VFTO. The breakdown characteristics of sphere-plane gap and rod-plane gap in SF6 under VFTO and LI were investigated for different gas pressures. Experimental results show that the breakdown voltages in slightly inhomogeneous field gaps under VFTO are higher than that under LI. However, for the rod-plane gaps, the breakdown voltages and voltage-time curves under VFTO fall below that of LI at higher pressure in the case of negative polarity. The polarity effect of rod-plane gaps under LI is reversed at a certain pressure. Based on the analyses, it is concluded that the different breakdown characteristics of SF6 gaps may be attribute to the difference between space charge behaviors during the discharge development under the impulse with different wave front and oscillation tail of VFTO and LI.
Keywords :
SF6 insulation; electric breakdown; gas insulated switchgear; lightning; overvoltage protection; space charge; GIS; SF6; breakdown voltages; discharge development; gas insulated switchgear; inhomogeneous field gaps; insulation characteristics; lightning impulse; rod-plane gap; space charge; sphere-plane gap; very fast transient overvoltage; voltage 1100 kV; voltage-time curves; Corona; Electrodes; Nonuniform electric fields; Sulfur hexafluoride; GIS; VFTO; breakdown voltage; lightning impulse; space charge;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2012.6215109