• DocumentCode
    1537607
  • Title

    In/sub 0.53/Ga/sub 0.47/As/InP floating guard ring avalanche photodiodes fabricated by double diffusion

  • Author

    Ackley, D.E. ; Hladky, J. ; Lange, M.J. ; Mason, S. ; Erickson, G. ; Olsen, G.H. ; Ban, V.S. ; Liu, Y. ; Forrest, S.R.

  • Author_Institution
    Epitaxx Inc., Princeton, NJ, USA
  • Volume
    2
  • Issue
    8
  • fYear
    1990
  • Firstpage
    571
  • Lastpage
    573
  • Abstract
    In/sub 0.53/Ga/sub 0.47/As/InP separate absorption and multiplication region avalanche photodiodes (SAM-APDs) with doubly diffused floating guard rings have been demonstrated. The planar, front-side illuminated devices are easily fabricated and incorporate strong guarding against edge and surface breakdown. Edge gain is suppressed both by the action of the floating guard rings and by the grading of the p-n junction at the outer edges of the active region that results from the second diffusion. Uniform gains as high as 85 have been measured at multiplied dark currents <100 nA. Multiplied dark currents below 5 nA have been measured at 90% of breakdown, with capacitances below 400 fF for front-side illuminated devices. The low values of dark current and capacitance, as well as the ease of fabrication, make the devices well suited for fiber-optic applications.<>
  • Keywords
    III-V semiconductors; avalanche photodiodes; gallium arsenide; indium compounds; optical workshop techniques; In/sub 0.53/Ga/sub 0.47/As-InP; active region; capacitance; double diffusion; edge breakdown; fiber-optic applications; floating guard ring avalanche photodiodes; front-side illuminated devices; multiplied dark currents; p-n junction; photodiode breakdown; second diffusion; separate absorption and multiplication region avalanche photodiodes; surface breakdown; Absorption; Avalanche photodiodes; Capacitance measurement; Current measurement; Dark current; Electric breakdown; Fabrication; Gain measurement; Indium phosphide; P-n junctions;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.58052
  • Filename
    58052