• DocumentCode
    1537850
  • Title

    Elimination of the Skin Effect Error in Heavy-Current Shunts

  • Author

    Malewski, Ryszard ; Nguyen, Chinh T. ; Feser, Kurt ; Hyltén-Cavallius, Nils

  • Author_Institution
    Institut de recherche d´´Hydro-Qu??bec, Varennes, Qu??bec, Canada
  • Issue
    3
  • fYear
    1981
  • fDate
    3/1/1981 12:00:00 AM
  • Firstpage
    39
  • Lastpage
    39
  • Abstract
    Summary form only given, as follows.
  • Keywords
    Circuits; Current density; Current measurement; Skin effect; Thermal resistance; Time measurement; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Power Engineering Review, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1724
  • Type

    jour

  • DOI
    10.1109/MPER.1981.5511325
  • Filename
    5511325
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1537850