• DocumentCode
    1537914
  • Title

    Scaling theory in modern VLSI

  • Author

    Ferry, D.K. ; Akers, L.A.

  • Author_Institution
    Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
  • Volume
    13
  • Issue
    5
  • fYear
    1997
  • fDate
    9/1/1997 12:00:00 AM
  • Firstpage
    41
  • Lastpage
    44
  • Abstract
    Discusses the scaling rules for VLSI that pertain to the total wire length and the clock speed. The analysis indicates that the total wire length is not increasing as rapidly as standard scaling theory would indicate. This results from over-scaling of the cell size reduction from one generation to the next (as predicted by Moore [1975]). However, the total wire length is still increasing at a rate that will cause significant power dissipation in the interconnects and indicates the need for new locally interconnected architectures. Moreover, the over-scaling of cell size reduction also raises the possible limitations that arise as the cell size is reduced faster than the gate length. We also discussed the effects of scaling on on-die clock speed. While gate-array clock speeds are scaling slower than the scaling rules would predict (a problem for large multi-chip architectures), clock speeds in modern VLSI chips track the scaling rule quite accurately
  • Keywords
    VLSI; clocks; integrated circuit design; integrated circuit interconnections; wiring; VLSI; cell size reduction; clock speed; gate length; locally interconnected architectures; multi-chip architectures; on-die clock speed; power dissipation; scaling rules; total wire length; Circuit testing; Clocks; Costs; Data buses; Delay; Integrated circuit interconnections; Integrated circuit packaging; Pins; Very large scale integration; Wire;
  • fLanguage
    English
  • Journal_Title
    Circuits and Devices Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    8755-3996
  • Type

    jour

  • DOI
    10.1109/101.621606
  • Filename
    621606