DocumentCode
1537914
Title
Scaling theory in modern VLSI
Author
Ferry, D.K. ; Akers, L.A.
Author_Institution
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
Volume
13
Issue
5
fYear
1997
fDate
9/1/1997 12:00:00 AM
Firstpage
41
Lastpage
44
Abstract
Discusses the scaling rules for VLSI that pertain to the total wire length and the clock speed. The analysis indicates that the total wire length is not increasing as rapidly as standard scaling theory would indicate. This results from over-scaling of the cell size reduction from one generation to the next (as predicted by Moore [1975]). However, the total wire length is still increasing at a rate that will cause significant power dissipation in the interconnects and indicates the need for new locally interconnected architectures. Moreover, the over-scaling of cell size reduction also raises the possible limitations that arise as the cell size is reduced faster than the gate length. We also discussed the effects of scaling on on-die clock speed. While gate-array clock speeds are scaling slower than the scaling rules would predict (a problem for large multi-chip architectures), clock speeds in modern VLSI chips track the scaling rule quite accurately
Keywords
VLSI; clocks; integrated circuit design; integrated circuit interconnections; wiring; VLSI; cell size reduction; clock speed; gate length; locally interconnected architectures; multi-chip architectures; on-die clock speed; power dissipation; scaling rules; total wire length; Circuit testing; Clocks; Costs; Data buses; Delay; Integrated circuit interconnections; Integrated circuit packaging; Pins; Very large scale integration; Wire;
fLanguage
English
Journal_Title
Circuits and Devices Magazine, IEEE
Publisher
ieee
ISSN
8755-3996
Type
jour
DOI
10.1109/101.621606
Filename
621606
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