• DocumentCode
    1538026
  • Title

    Slow wave propagation using interconnections for IC technologies

  • Author

    Gammand, P. ; Bajon, D.

  • Author_Institution
    Labs. d´Electron. Philips, Limeil-Brevannes, France
  • Volume
    26
  • Issue
    18
  • fYear
    1990
  • Firstpage
    1443
  • Lastpage
    1445
  • Abstract
    A microstrip slow wave transmission line, based on a periodic structure made with the two metallic levels used in ICs, is described. Using on-wafer measurements, an effective permittivity as high as 20 in a wide microwave frequency range is reported. The transmission line has also been measured to obtain the characteristic impedance and the losses. Using the basic periodic structure theory the propagation constant of this media has been computed and good agreement has been obtained with that of the measurement. This slow wave structure is very promising for use in MMIC because of its very compact design.
  • Keywords
    MMIC; dielectric loss measurement; electric impedance measurement; integrated circuit technology; permittivity measurement; strip lines; IC technology; MMIC; characteristic impedance; effective permittivity; microstrip slow wave transmission line; on-wafer measurements; periodic structure; propagation constant; slow wave structure;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19900926
  • Filename
    58080