• DocumentCode
    1538518
  • Title

    Observation of tungsten particles in vacuum arcs by laser induced fluorescence

  • Author

    Nakayama, Yasushi ; Kimura, Toshinori ; Koyama, Kenichi ; Sasao, Hiroyuki

  • Author_Institution
    Adv. Technol. Res. & Dev. Centre, Mitsubishi Electr. Corp., Hyogo, Japan
  • Volume
    27
  • Issue
    4
  • fYear
    1999
  • fDate
    8/1/1999 12:00:00 AM
  • Firstpage
    906
  • Lastpage
    910
  • Abstract
    We have clarified the relation between the decay of tungsten ion density in the vicinity of current zero and vacuum arc mode in high current period by using a laser induced fluorescence method in tungsten vacuum arcs of 60 Hz sinusoidal current with the peak value of 3.3, 6.7, and 9.8 kA. In the case of 6.7 kA, the arc mode was the anode spot mode. Because of the generation of the anode spot, the tungsten ion density near the anode was higher than near the cathode and the density near the anode was about ten times as high as the case of 3.3 kA which was the diffuse mode. In the case of 9.8 kA, which was the intense arc mode, the density near the anode was not significantly different from the case of 6.7 kA. The density near the cathode was higher than near the anode and tungsten ions were observed till about 30 μs after current zero while they disappeared at current zero in the other cases
  • Keywords
    fluorescence; ion density; plasma diagnostics; tungsten; vacuum arcs; 3.3 kA; 6.7 A; 60 Hz; 9.8 A; W; W ion density decay; W particles; anode spot mode; current interruption; current zero mode; diffuse mode; high current period; high speed video camera; intense arc mode; laser induced fluorescence; laser induced fluorescence method; sinusoidal current; tungsten particles; vacuum arc mode; vacuum arcs; vacuum interrupter; Anodes; Cathodes; Electrodes; Fluorescence; Laser excitation; Laser modes; Laser transitions; Particle measurements; Tungsten; Vacuum arcs;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.782258
  • Filename
    782258