• DocumentCode
    1538585
  • Title

    Impact of Process Variations on Upset Reversal in a 65 nm Flip-Flop

  • Author

    Kauppila, Amy V. ; Ball, Dennis R. ; Bhuva, Bharat L. ; Massengill, Lloyd W. ; Holman, W. Tim

  • Author_Institution
    Electrical Engineering and Computer Science, Vanderbilt University, Nashville, United States
  • Volume
    59
  • Issue
    4
  • fYear
    2012
  • Firstpage
    886
  • Lastpage
    892
  • Abstract
    This work postulates a mechanism, upset reversal, and analyzes the impact of process variations on the mechanism. Process variations are shown to affect the onset of upset reversal for a 65 nm flip-flop.
  • Keywords
    Inverters; Logic gates; MOSFETs; Monte Carlo methods; Single event upset; Flip-flops; process parameter variations; single event transient; upset reversal;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2012.2196448
  • Filename
    6216463
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1538585