• DocumentCode
    1538647
  • Title

    A stable and efficient admittance method via adjacence graphs and recursive thresholding

  • Author

    Tarricone, Luciano ; Mongiardo, Mauro

  • Author_Institution
    Dipartimento di Ingegneria Elettronica e dell´´Inf., Perugia Univ., Italy
  • Volume
    49
  • Issue
    10
  • fYear
    2001
  • fDate
    10/1/2001 12:00:00 AM
  • Firstpage
    1750
  • Lastpage
    1756
  • Abstract
    The generalized admittance method is a rigorous full-wave approach for the analysis of waveguide circuits. Unfortunately, it may present the risk of ill conditioning, especially when very complex structures are analyzed with a considerably high number of modes. In this paper, the concepts of adjacence graph and recursive thresholding are proposed to solve its numerical problems. By applying the proposed strategy, the linear system representing the core of the analysis is partitioned into many independent and well-conditioned subsystems, thus improving the numerical stability of the approach and its efficiency. The attractive features of the proposed approach are its simplicity and immediate implementation. Results are given, referred to a real industrial case, a complex E/H-plane filter, whose analysis could not be performed via a standard admittance method when a very high number of modes were considered. With the present approach, the ill conditioning is avoided and considerable enhancements in computing times is achieved
  • Keywords
    electric admittance; graph theory; numerical stability; sparse matrices; waveguide filters; adjacence graph; complex E/H-plane filter; full-wave analysis; generalized admittance method; linear system; numerical stability; recursive thresholding; sparse matrix; waveguide circuit; Admittance; Circuit analysis; Design automation; Filters; Helium; Linear systems; Numerical stability; Performance analysis; Risk analysis; Sparse matrices;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.954780
  • Filename
    954780