• DocumentCode
    1538808
  • Title

    CMOS device with self-aligned source/drain using amorphous silicon local interconnection layer

  • Author

    Yoon, Yong-Sun ; Baek, Kyu-Ha ; Nam, Kee-Soo

  • Author_Institution
    Electron. & Telecommun. Res. Inst., Taejon, South Korea
  • Volume
    33
  • Issue
    5
  • fYear
    1997
  • fDate
    2/27/1997 12:00:00 AM
  • Firstpage
    389
  • Lastpage
    390
  • Abstract
    A novel CMOS device, which has a self-aligned source/drain structure using an amorphous silicon local interconnection (ASLI) layer is demonstrated. The proposed device not only has very small areas of source/drain junctions, but also has shallow junction depths much shallower than conventional structures. The capacitance reduction of the source/drain junctions significantly enhances the operating speed
  • Keywords
    CMOS integrated circuits; amorphous semiconductors; capacitance; integrated circuit interconnections; integrated circuit technology; ASLI layer; CMOS device; Si; amorphous Si local interconnection layer; capacitance reduction; operating speed enhancement; self-aligned source/drain; shallow junction depths;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19970262
  • Filename
    581040