Title :
A fault-tolerant GaAs/CMOS interconnection network for scalable multiprocessors
Author :
Butner, steven E. ; Bordelon, Scott L. ; Endres, Lisa ; Dodd, James ; Shetler, Joy
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fDate :
5/1/1991 12:00:00 AM
Abstract :
The design of an interconnection network (ICN) for a scalable multiprocessor system is presented. The tree-structured network (called SHUNT for scalable hierarchical unidirectional network topology) is organized so that it can be scaled not only in width (through the use of bit slicing), but also in number of ports and in data transfer speed. The network is made from three custom chip types: cluster controller, crossbar switch, and network interface. Implementation of the first prototype chips in 2-μm CMOS is discussed, and the results of detailed circuit simulations for GaAs implementations are given. The network is fault tolerant and is able to detect and correct all single-bit transmission errors. In addition, it can detect failures and reconfigure to work around problems in controllers, port interfaces, or user processors. The network is part of the experimental decoupled computer architect project (DART) currently under study and development
Keywords :
CMOS integrated circuits; III-V semiconductors; application specific integrated circuits; digital integrated circuits; error correction; error detection; fault tolerant computing; gallium arsenide; multiprocessor interconnection networks; 2 micron; ASIC; CMOS interconnection network; DART; GaAs; SHUNT; bit slicing; cluster controller; crossbar switch; custom chip; decoupled computer architect project; fault-tolerant; monolithic IC; network interface; scalable hierarchical unidirectional network topology; scalable multiprocessor system; single-bit transmission errors; tree-structured network; Circuit simulation; Electrical fault detection; Fault tolerance; Gallium arsenide; Multiprocessing systems; Multiprocessor interconnection networks; Network interfaces; Network topology; Switches; Virtual prototyping;
Journal_Title :
Solid-State Circuits, IEEE Journal of