• DocumentCode
    1538945
  • Title

    A 3-ns range, 8-ps resolution, timing generator LSI utilizing Si bipolar gate array

  • Author

    Otsuji, Tai-Ichi ; Narumi, Naoaki

  • Author_Institution
    NTT LSI Lab., Kanagawa, Japan
  • Volume
    26
  • Issue
    5
  • fYear
    1991
  • fDate
    5/1/1991 12:00:00 AM
  • Firstpage
    806
  • Lastpage
    811
  • Abstract
    A 3-ns-range, 8-ps-resolution timing generator LSI has been realized by using Si bipolar gate arrays. By adopting a redundant weighted delay-unit matrix based on a process-insensitive polynomial formulation, ±2-ps linearity error has been attained at input clock rates of up to 700 MHz. Thermal noise and interconnection crosstalk have been quantitatively investigated as critical factors causing timing error. By adopting the results to the circuit and layout design, thermal jitter and systematic timing error due to crosstalk were successfully suppressed to less than 8 and ±5 ps. respectively
  • Keywords
    bipolar integrated circuits; crosstalk; electron device noise; elemental semiconductors; errors; large scale integration; logic arrays; silicon; timing circuits; 3 ns; 700 MHz; Si bipolar gate array; input clock rates; interconnection crosstalk; layout design; process-insensitive polynomial formulation; redundant weighted delay-unit matrix; thermal jitter; thermal noise; timing error; timing generator LSI; Circuit noise; Clocks; Crosstalk; Delay; Integrated circuit interconnections; Large scale integration; Linearity; Polynomials; Thermal factors; Timing;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.78252
  • Filename
    78252