• DocumentCode
    1539021
  • Title

    An intelligent BiCMOS/DMOS quad 1-A high-side switch

  • Author

    Hobrecht, Stephen

  • Author_Institution
    Nat. Semicond. Corp., Santa Clara, CA, USA
  • Volume
    25
  • Issue
    6
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    1395
  • Lastpage
    1402
  • Abstract
    A fully protected quad high-side DMOS switch has been realized using a BiCMOS/DMOS process. A bipolar multiplier cell calculates and limits instantaneous power dissipated by each 0.8-Ω DMOS power switch to 13 W. The integrated circuit shuts down to protect itself if a safe temperature or operating voltage is exceeded. A thermal warning is provided when the junction temperature rises to within 20°C of the shutdown temperature such that an orderly system turn-off occurs. A serial output data pin reports status information including channel on/off, open and shorted load faults, warning and shutdown temperatures, and an overvoltage condition. The circuit withstands a supply voltage of 60 V and operates from 6 to 32 V. The IC can be permanently connected to the power while drawing no DC current in the standby mode. The device fits into a 20-pin dual-in-line package having the die-attach paddle and the center four pins of the lead frame being a continuous strip of metal providing a low thermal resistance path from which to extract heat from the output switches
  • Keywords
    BIMOS integrated circuits; power integrated circuits; switching circuits; 6 to 32 V; BiCMOS/DMOS process; bipolar multiplier cell; die-attach paddle; dual-in-line package; junction temperature; load faults; operating voltage; overvoltage condition; quad high-side DMOS switch; safe temperature; system turn-off; thermal resistance path; thermal warning; BiCMOS integrated circuits; Bipolar integrated circuits; Circuit faults; Packaging; Pins; Power system protection; Switches; Temperature; Thermal resistance; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.62167
  • Filename
    62167