• DocumentCode
    1539126
  • Title

    A fast time-domain finite element-boundary integral method for electromagnetic analysis

  • Author

    Jiao, Dan ; Lu, Mingyu ; Michielssen, Eric ; Jin, Jian-Ming

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    49
  • Issue
    10
  • fYear
    2001
  • fDate
    10/1/2001 12:00:00 AM
  • Firstpage
    1453
  • Lastpage
    1461
  • Abstract
    A time-domain, finite element-boundary integral (FE-BI) method is presented for analyzing electromagnetic (EM) scattering from two-dimensional (2-D) inhomogeneous objects. The scheme´s finite-element component expands transverse fields in terms of a pair of orthogonal vector basis functions and is coupled to its boundary integral component in such a way that the resultant finite element mass matrix is diagonal, and more importantly, the method delivers solutions that are free of spurious modes. The boundary integrals are computed using the multilevel plane-wave time-domain algorithm to enable the simulation of large-scale scattering phenomena. Numerical results demonstrate the capabilities and accuracy of the proposed hybrid scheme
  • Keywords
    boundary integral equations; electromagnetic wave scattering; finite element analysis; matrix algebra; time-domain analysis; 2D inhomogeneous objects; EM scattering; diagonal finite element mass matrix; electromagnetic analysis; electromagnetic scattering; fast time-domain method; large-scale scattering phenomena; multilevel plane-wave time-domain algorithm; orthogonal vector basis functions; time-domain finite element-boundary integral; transverse fields expansion; two-dimensional inhomogeneous objects; Electromagnetic analysis; Electromagnetic scattering; Finite difference methods; Finite element methods; Frequency domain analysis; Integral equations; Maxwell equations; Time domain analysis; Transient analysis; Two dimensional displays;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.954934
  • Filename
    954934