• DocumentCode
    1539310
  • Title

    Class-AB SiC CMOS power opamp with stable voltage gain over wide temperature range

  • Author

    Chen, J.-S. ; Kornegay, K.T.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    144
  • Issue
    1
  • fYear
    1997
  • fDate
    2/1/1997 12:00:00 AM
  • Firstpage
    22
  • Lastpage
    28
  • Abstract
    A class-AB silicon carbide CMOS power operational amplifier with stable open-loop voltage gain over a wide temperature range is presented. A temperature-insensitive voltage reference is designed to provide bias voltages for the operational amplifier. An extra bias circuit is also developed such that the voltage gain of the operational amplifier can be insensitive to threshold voltage and mobility variations. A class-AB output stage combined with a novel adaptive biasing scheme is developed to produce a full rail-to-rail output swing and low output resistance of 90 Ω at 75°C. A nested Miller-compensated topology is also incorporated to provide a phase margin of 60°. The DC gain of the operational amplifier only experiences a 1.265 dB variation over a temperature range of 75 to 300°C and a 3.387 dB variation from VDD(-VSS)=5.0 V to VDD(-VSS)=20 V. This operational amplifier is ideal for use as a voltage buffer or power amplifier intended for high temperature operation
  • Keywords
    CMOS analogue integrated circuits; buffer circuits; compensation; operational amplifiers; power amplifiers; reference circuits; silicon compounds; 1.265 dB; 3.387 dB; 5 to 20 V; 75 C; 75 to 300 C; 90 ohm; DC gain; SiC; adaptive biasing; adaptive biasing scheme; bias circuit; bias voltages; class-AB CMOS power operational amplifier; high temperature operation; mobility variations; nested Miller-compensated topology; open-loop voltage; output resistance; phase margin; rail-to-rail output swing; stable voltage gain; temperature compensation; temperature-insensitive voltage reference; voltage buffer; voltage gain;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2409
  • Type

    jour

  • DOI
    10.1049/ip-cds:19970828
  • Filename
    581233