• DocumentCode
    1539313
  • Title

    Suspended epitaxial YBaCuO bolometers on silicon and SIMOX substrates

  • Author

    Mechin, L. ; Villegier, J.-C. ; Bloyet, D.

  • Author_Institution
    CEA, Centre d´Etudes Nucleaires de Grenoble, France
  • Volume
    7
  • Issue
    2
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    2382
  • Lastpage
    2385
  • Abstract
    Suspended epitaxial YBaCuO bolometers were successfully fabricated by two silicon micromachining techniques. The first one used the RIE (Reactive Ion Etching) of Si substrates and the second one the etching of the SiO/sub 2/ layer in SIMOX (Separated by IMplanted OXygen) substrates. Thermal conductances and time constants of different suspended bridges fabricated by RIE were measured as functions of length and width. The influence of the materials constituting the membrane was discussed by comparing a "RIE bridge" to a similar "SIMOX bridge". All measurements were consistent with calculations from thermal model. Experimental results and model lead to the optimization of a 100/spl times/100 /spl mu/m/sup 2/ IR detector. Its detectivity D*, measured at 85 K under irradiation from a blackbody, was 2.5 10/sup 9/ cm/spl radic/(Hz)/W, with a time constant of 564 /spl mu/s. These performances are among the best reported for YBaCuO bolometers.
  • Keywords
    SIMOX; barium compounds; bolometers; electron device manufacture; high-temperature superconductors; infrared detectors; micromachining; sputter etching; superconducting devices; superconducting epitaxial layers; yttrium compounds; IR detector; SIMOX substrate; Si; YBaCuO; bridge fabrication; membrane; micromachining; reactive ion etching; silicon substrate; suspended epitaxial YBaCuO bolometer; thermal conductance; time constant; Bolometers; Bridges; Etching; Micromachining; Oxygen; Silicon; Substrates; Thermal conductivity; Time measurement; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.621719
  • Filename
    621719