DocumentCode
1539691
Title
Persistent joint development for high field NMR
Author
Swenson, C.A. ; Markiewicz, W.D.
Author_Institution
Nat. High Magnetic Field Lab., Tallahassee, FL, USA
Volume
9
Issue
2
fYear
1999
fDate
6/1/1999 12:00:00 AM
Firstpage
185
Lastpage
188
Abstract
A large NMR magnet links several Nb/sub 3/Sn and NbTi coils in series. The circuit can contain as many as fifty superconducting joints. The persistence requirements of NMR impose limits on the total circuit resistance. Ideally the magnets total resistance is determined by the field integrated n-value loss in the coils and the resistive sum from the joints. Designing sufficient margin into each coil´s conductor can mitigate the decay resulting from n-value loss. Joint losses are the remaining aspect of the design that must be controlled for NMR, joint losses can be conservatively estimated from the upper limit in the resistance measurement sensitivity used during process development. An NMR magnet requires several joint configurations to allow fabrication and assembly of the circuit. There are joints between Nb/sub 3/Sn conductors inside coils, joints between NbTi conductors, and persistent joints between NbTi and Nb/sub 3/Sn conductors. A range of processing methods is required given the complexity of the assembly. This paper presents a review of this subject concerning the available methods for joint fabrication, a measurement method for process development, and supporting measurement results.
Keywords
cable jointing; electric resistance measurement; losses; niobium alloys; nuclear magnetic resonance; superconducting cables; superconducting coils; superconducting magnets; tin alloys; titanium alloys; Nb/sub 3/Sn; Nb/sub 3/Sn coils; Nb/sub 3/Sn conductors; Nb/sub 3/Sn-Nb/sub 3/Sn persistent joints; Nb/sub 3/Sn-NbTi; Nb/sub 3/Sn-NbTi persistent joints; NbTi; NbTi coils; NbTi conductors; NbTi-NbTi persistent joints; coils; field integrated n-value loss; high field NMR; joint fabrication; joint losses; magnets total resistance; persistent joint development; process development measurement; resistance measurement sensitivity; total circuit resistance; Assembly; Circuits; Conductors; Fabrication; Niobium compounds; Nuclear magnetic resonance; Superconducting coils; Superconducting magnets; Tin; Titanium compounds;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.783267
Filename
783267
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