DocumentCode :
1539873
Title :
Growth of single crystal beta -SiC films on a Si substrate by a direct carbonisation method
Author :
Hirano, Yoshikuni ; Inada, Takashi
Author_Institution :
Coll. of Eng., Hosei Univ., Tokyo, Japan
Volume :
26
Issue :
20
fYear :
1990
Firstpage :
1638
Lastpage :
1640
Abstract :
Single crystal beta -SiC films have been formed on a Si substrate by a thermal reaction between the substrate and carbon atoms sublimed from a high purity graphite source. The film properties are characterised by the Rutherford backscattering technique and an electron diffraction method. It has been demonstrated that single crystal beta -SiC films are formed on a
Keywords :
semiconductor growth; semiconductor materials; silicon compounds; thin film devices; vapour phase epitaxial growth; 900 degC; Rutherford backscattering; Si substrate; beta SiC-Si films; direct carbonisation method; electron diffraction method; film properties; heteroepitaxy; high purity graphite source; single crystal beta SiC films; sublimed C; thermal reaction;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19901049
Filename :
58151
Link To Document :
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