Title :
Waveguided electro-optical intensity modulation in a Si/GexSi1-x/Si heterojunction bipolar transistor
Author :
Lareau, R.D. ; Friedman, L. ; Soref, Richard A.
Author_Institution :
Dept. of Electr. Eng., Worcester Polytech. Inst., MA, USA
Abstract :
Optical phase-and-amplitude modulation at 1.55 mu m in an electro-optic guided-wave Si/Ge0.2Si0.8/Si HBT is investigated using computer-aided modelling and simulation. At an injection of 1019 electrons per cm3, an intensity modulation of 10 dB is predicted for an active length of 390 mu m.
Keywords :
Ge-Si alloys; electro-optical devices; heterojunction bipolar transistors; optical communication equipment; optical modulation; optical waveguide components; semiconductor device models; semiconductor junctions; 1.55 micron; active length; computer-aided modelling; heterojunction bipolar transistor; intensity modulation; phase-and-amplitude modulation; waveguided electrooptic intensity modulation;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19901059