Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity

Several architectures of Bulk Built-In Current Sensors (BBICS) were recently proposed to monitor transient faults induced on integrated circuits by radiation or malicious sources. This work compares for the first time all existing static BBICS architectures in terms of their sensitivities to detect transient faults. In addition, we propose a new static BBICS that presents better results of transient-fault detection sensitivity than previous sensor architectures.