DocumentCode :
1540111
Title :
High-resistivity SNS Josephson junctions scribed in YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// by electron irradiation
Author :
Davidson, B.A. ; Hinaus, B. ; Rzchowski, M. ; Siangchaew, K. ; Libera, M. ; Nordman, J.E.
Author_Institution :
Wisconsin Univ., Madison, WI, USA
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
2518
Lastpage :
2521
Abstract :
We demonstrate that the behavior of Josephson junctions scribed in YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (YBCO) with a high-brightness electron source are described well by conventional superconductor-normal-superconductor (SNS) theory. These junction characteristics include a fully normal interlayer (T/sub cN/=0), intermediate length (L//spl xi//sub n/(T/sub c/)/spl ap/8-10), and a reduced order parameter at the SN interface. Consistent application of this model of diffusive transport across a metallic interlayer in the dirty limit requires a reduced carrier concentration in the irradiated region, a junction length L/spl ap/5 nm, and a normal resistivity near the metallic limit. I/sub c/R/sub n/ products higher than 3 mV at low temperatures are observed.
Keywords :
Josephson effect; barium compounds; carrier density; critical currents; electron beam lithography; high-temperature superconductors; yttrium compounds; YBa/sub 2/Cu/sub 3/O/sub 7/; carrier concentration; diffusive transport; dirty limit; electron irradiation; high-brightness electron source; high-resistivity SNS Josephson junctions; junction length; normal interlayer; normal resistivity; order parameter; Boundary conditions; Critical current; Current measurement; Electrodes; Electrons; Josephson junctions; Magnetic field measurement; RNA; Temperature distribution; Temperature measurement;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.621751
Filename :
621751
Link To Document :
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