A frequency-domain approach to shallow-water depth measurement

Author

Pillai, S. Radhakrishnan ; Antoniou, Andreas

Author_Institution

Adv. Dev. Group, Zetron Inc., Redmond, WA, USA

Volume

35

Issue

3

fYear

1997

fDate

5/1/1997 12:00:00 AM

Firstpage

540

Lastpage

545

Abstract

A new formulation for ocean-depth measurement using a frequency-domain approach is proposed. This technique uses two high-resolution eigensubspace methods to estimate the ocean depth from backscattered noisy data. The problem has been addressed both for real and complex attenuation coefficients by utilizing a double eigenstructure decomposition procedure on a Toeplitz as well as a Hankel matrix structure. The approach is similar to obtaining the best rational approximation that fits the actual measured data in a least-square sense

Keywords

bathymetry; geophysical techniques; oceanographic techniques; optical radar; remote sensing by laser beam; seafloor phenomena; Hankel matrix structure; Toeplitz; airborne method; backscattered noisy data; coastal bathymetry; double eigenstructure decomposition; formulation; frequency-domain approach; geophysical measurement technique; high-resolution eigensubspace method; laser remote sensing; lidar method; ocean; ocean-depth measurement; sea coast; seafloor geology; shallow-water depth measurement; Frequency measurement; Laser noise; Oceanographic techniques; Oceans; Optical pulses; Optical reflection; Particle scattering; Sea measurements; Sea surface; Surface emitting lasers;

fLanguage

English

Journal_Title

Geoscience and Remote Sensing, IEEE Transactions on

Publisher

ieee

ISSN

0196-2892

Type

jour

DOI

10.1109/36.581962

Filename

581962