• DocumentCode
    1540431
  • Title

    Fault detection method using power supply spectrum analysis

  • Author

    Lee, P. ; O´Leary, P.

  • Author_Institution
    Austria Mikro Syst. Int. GmbH, Unterpremstatten, Austria
  • Volume
    26
  • Issue
    20
  • fYear
    1990
  • Firstpage
    1733
  • Lastpage
    1734
  • Abstract
    A test method is presented which uses power supply current spectrum measurements to identify and localise faults in CMOS integrated circuits. Measurements on a mixed analogue and digital test chip are presented to verify the proposed test method.
  • Keywords
    CMOS integrated circuits; fault location; spectral analysis; CMOS integrated circuits; current spectrum measurements; faults; mixed analogue/digital chip; power supply spectrum analysis; test method;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19901106
  • Filename
    58208
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1540431