DocumentCode
1540507
Title
High resolution ADC system
Author
Rylov, S.V. ; Bunz, L.A. ; Gaidarenko, D.V. ; Fisher, M.A. ; Robertazzi, R.P. ; Mukhanov, O.A.
Author_Institution
HYPRES Inc., Elmsfrd, NY, USA
Volume
7
Issue
2
fYear
1997
fDate
6/1/1997 12:00:00 AM
Firstpage
2649
Lastpage
2652
Abstract
We have developed and verified experimentally a novel high-resolution superconducting ADC architecture based on phase modulation/demodulation principle and implemented in RSFQ logic. We have demonstrated an ADC chip providing full implementation of this architecture, including on-chip decimation filter and multiple-channel synchronizer. We have also developed a digital ADC evaluation system consisting of an interface electronics block converting the low-voltage ADC output to standard TTL form at multi-MHz sampling rate, and a computerized test station performing data acquisition, processing and display in real time. Using this system we have demonstrated that for low-frequency (kHz) signals our ADC chips possess linearity in excess of 16 bits with Spur-Free Dynamic Range over 108 dB, which is an important benchmark for any high-resolution ADC technology.
Keywords
analogue-digital conversion; automatic test equipment; automatic testing; integrated circuit testing; phase modulation; superconducting device testing; superconducting integrated circuits; synchronisation; ADC chip; RSFQ logic; computerized test station; data acquisition; digital ADC evaluation system; high resolution ADC system; interface electronics block; linearity; low-voltage ADC output conversion; multi-MHz sampling rate; multiple-channel synchronizer; onchip decimation filter; phase demodulation; phase modulation; spur-free dynamic range; standard TTL form; superconducting ADC architecture; Computer architecture; Computer displays; Computer interfaces; Demodulation; Electronic equipment testing; Phase modulation; Signal sampling; Standards development; Superconducting filters; Superconducting logic circuits;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.621783
Filename
621783
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