DocumentCode
1540514
Title
Interface circuits for chip-to-chip data transfer at GHz rates
Author
Przybysz, J.X. ; Miller, D.L. ; Martinet, S.S. ; Joonhee Kang ; Hedge Worsham, A. ; Farich, M.L.
Author_Institution
Northrop Grummen Sci. & Technol. Center, Pittsburgh, PA, USA
Volume
7
Issue
2
fYear
1997
fDate
6/1/1997 12:00:00 AM
Firstpage
2657
Lastpage
2660
Abstract
Interface circuits for the transfer of data between Single Flux Quantum (SPQ) circuits have been designed, fabricated, and operated at speeds up to 3 Gigabits per second. The circuit employed an improved version of the SFQ/Latch converter, a Modified Variable Threshold Logic (MVTL) OR/AND gate, a 3/spl times/ latching amplifier, and a 3/spl times/-to-10/spl times/ latching amplifier. The amplifier circuits employed stacks of latching junctions. Resistors between the parallel stacks of junctions damped residual currents to prevent flux trapping during reset. Tolerance to critical current variations in the series stacks of junctions was provided by inductive chokes on the input junction shunting resistors. Microwave modeling programs were used to ensure proper distribution of the applied current to all of the latching elements. The circuit transferred data at 3 Gigabits per second from one SFQ circuit up to room temperature and back to another SFQ circuit through 3.4 meters of 50-ohm cable.
Keywords
superconducting device testing; superconducting logic circuits; threshold logic; 3 Gbit/s; GHz rates; MVTL OR/AND gate; SFQ circuit; chip-to-chip data transfer; critical current variations tolerance; inductive chokes; input junction shunting resistors; interface circuits; latch converter; latching amplifier; latching junctions stack; microwave modeling programs; modified variable threshold logic; parallel stacks; single flux quantum circuits; Coaxial cables; Communication cables; Critical current; Josephson junctions; Logic circuits; Logic gates; Power cables; Resistors; Switches; Temperature;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.621785
Filename
621785
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