Title :
Error rate of RSFQ circuits: theory
Author :
Herr, Q.P. ; Feldman, M.J.
Author_Institution :
Dept. of Electr. Eng., Rochester Univ., NY, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
For the first time, the bit-error rate of an active SFQ experiment is compared to theoretical prediction. The theory of thermally induced errors is developed using the Fokker-Planck equation. The equivalent noise temperature of the experiment is found to be 11.0 K. The error rate vs. bias current follows an error function dependence and extrapolates to vanishingly small error rate at optimal bias.
Keywords :
Fokker-Planck equation; error analysis; error statistics; superconducting logic circuits; BER; Fokker-Planck equation; RSFQ circuits; active SFQ experiment; bias current; bit-error rate; equivalent noise temperature; error function dependence; rapid single flux quantum circuits; thermally induced errors; Bit error rate; Circuit noise; Circuit testing; Equations; Error analysis; Frequency; Josephson junctions; Logic gates; Superconducting device noise; Temperature;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
