• DocumentCode
    1540600
  • Title

    Formal Theoretical Foundation of Electrical Aging of Dielectrics

  • Author

    Kiersztyn, Stanley E.

  • Author_Institution
    General Electric Company, Bridgeport, Connecticut
  • Issue
    11
  • fYear
    1981
  • Firstpage
    15
  • Lastpage
    15
  • Abstract
    Summary form only given, as follows.
  • Keywords
    Aging; Degradation; Dielectric breakdown; Differential equations; Electric breakdown; Mathematical model; Probability distribution; Residual stresses;
  • fLanguage
    English
  • Journal_Title
    Power Engineering Review, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1724
  • Type

    jour

  • DOI
    10.1109/MPER.1981.5511887
  • Filename
    5511887