DocumentCode :
1540878
Title :
A statistical approach to prediction of ZnO arrester element characteristics
Author :
Boggs, Steven ; Andoh, Hideyasu
Author_Institution :
Electr. Insulation Res. Center, Connecticut Univ., Storrs, CT, USA
Volume :
16
Issue :
4
fYear :
2001
fDate :
10/1/2001 12:00:00 AM
Firstpage :
604
Lastpage :
610
Abstract :
ZnO arrester elements consist of ZnO grains with dimensions in the range of 10 to 100 μm, the boundaries between which form double Shottky junctions with conduction voltages in the range of 3.5 V. A fraction of the grains contain no conducting boundaries with other grains, which results in the percolation path for current across the ZnO element being a statistical parameter which is a function of the fraction of nonconducting grains, which also affects the nonlinear properties of the element. In this paper, we use a simple statistical approach to predict the effect of the fraction of nonconducting grains on the nonlinear properties of the element. This computationally simple approach gives results which are comparable to far more complex approaches which require solving a network of nonlinear resistive elements
Keywords :
arresters; grain boundaries; nonlinear media; semiconductor junctions; statistical analysis; zinc compounds; 10 to 100 mum; ZnO; ZnO arrester element characteristics; ZnO element; ZnO grains; conduction voltages; double Shottky junctions; nonconducting grains; nonlinear properties; nonlinear resistive elements; percolation path; statistical parameter; Arresters; Conducting materials; Electron traps; Feedback; Grain boundaries; Physics; Solid state circuits; Stability; Temperature; Zinc oxide;
fLanguage :
English
Journal_Title :
Power Delivery, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8977
Type :
jour
DOI :
10.1109/61.956744
Filename :
956744
Link To Document :
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