• DocumentCode
    1540878
  • Title

    A statistical approach to prediction of ZnO arrester element characteristics

  • Author

    Boggs, Steven ; Andoh, Hideyasu

  • Author_Institution
    Electr. Insulation Res. Center, Connecticut Univ., Storrs, CT, USA
  • Volume
    16
  • Issue
    4
  • fYear
    2001
  • fDate
    10/1/2001 12:00:00 AM
  • Firstpage
    604
  • Lastpage
    610
  • Abstract
    ZnO arrester elements consist of ZnO grains with dimensions in the range of 10 to 100 μm, the boundaries between which form double Shottky junctions with conduction voltages in the range of 3.5 V. A fraction of the grains contain no conducting boundaries with other grains, which results in the percolation path for current across the ZnO element being a statistical parameter which is a function of the fraction of nonconducting grains, which also affects the nonlinear properties of the element. In this paper, we use a simple statistical approach to predict the effect of the fraction of nonconducting grains on the nonlinear properties of the element. This computationally simple approach gives results which are comparable to far more complex approaches which require solving a network of nonlinear resistive elements
  • Keywords
    arresters; grain boundaries; nonlinear media; semiconductor junctions; statistical analysis; zinc compounds; 10 to 100 mum; ZnO; ZnO arrester element characteristics; ZnO element; ZnO grains; conduction voltages; double Shottky junctions; nonconducting grains; nonlinear properties; nonlinear resistive elements; percolation path; statistical parameter; Arresters; Conducting materials; Electron traps; Feedback; Grain boundaries; Physics; Solid state circuits; Stability; Temperature; Zinc oxide;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/61.956744
  • Filename
    956744