DocumentCode :
1541432
Title :
Conference Reports
Author :
Kapur, Rohit
Author_Institution :
Synopsys
Volume :
27
Issue :
4
fYear :
2010
Firstpage :
77
Lastpage :
77
Abstract :
Design and Test Conference Reports, July/August 2010
Keywords :
Design and Test Conference Reports;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2010.82
Filename :
5512530
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1541432
