Title :
kA class resistive fault current limiting device development using QMG HTC bulk superconductor
Author :
Ito, D. ; Yang, C. ; Miura, O. ; Morita, M. ; Tokunaga, T.
Author_Institution :
Tokyo Metropolitan Univ., Japan
fDate :
6/1/1999 12:00:00 AM
Abstract :
kA class HTC bulk superconducting elements of devices for a resistive type fault current limiter for 6 kV distribution networks have been developed and tested. The YBCO devices made with the quench melt growth (QMG) method has 20000 30000 A/cm/sup 2/ critical current densities at 77 K and 1 T determined by the 1 /spl mu/V/cm criterion for the current flow parallel to the a-b plane. The QMG device has 5 /spl mu//spl Omega/-m normal state resistivity and an n-value of approximately 6 for the same direction of current flow. An element of the device with a 1.5/spl times/1.5 mm/sup 2/ cross-section with silver electrodes formed by sputtering could successfully carry exceeding 2200 A/sub peak/ AC transport current in self field at 77 K.
Keywords :
critical current density (superconductivity); distribution networks; electrodes; fault current limiters; high-temperature superconductors; silver; sputtered coatings; 1 T; 1.5 mm; 2200 A; 6 kV; 77 K; AC transport current; Ag; QMG HTC bulk superconductor; Y/sub 2/BaCuO/sub 5/; critical current densities; current flow; distribution networks; quench melt growth method; resistive fault current limiting device; sputtered silver electrodes; state resistivity; Conductivity; Critical current density; Electrodes; Fault current limiters; Fault currents; Silver; Sputtering; Superconducting devices; Testing; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on