DocumentCode :
1541513
Title :
High- Q Tunable Microwave Cavity Resonators and Filters Using SOI-Based RF MEMS Tuners
Author :
Liu, Xiaoguang ; Katehi, Linda P B ; Chappell, William J. ; Peroulis, Dimitrios
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
19
Issue :
4
fYear :
2010
Firstpage :
774
Lastpage :
784
Abstract :
This paper presents the modeling, design, fabrication, and measurement of microelectromechanical systems-enabled continuously tunable evanescent-mode electromagnetic cavity resonators and filters with very high unloaded quality factors (Qu). Integrated electrostatically actuated thin diaphragms are used, for the first time, for tuning the frequency of the resonators/filters. An example tunable resonator with 2.6:1 (5.0-1.9 GHz) tuning ratio and Qu of 300-650 is presented. A continuously tunable two-pole filter from 3.04 to 4.71 GHz with 0.7% bandwidth and insertion loss of 3.55-2.38 dB is also shown as a technology demonstrator. Mechanical stability measurements show that the tunable resonators/filters exhibit very low frequency drift (less than 0.5% for 3 h) under constant bias voltage. This paper significantly expands upon previously reported tunable resonators.
Keywords :
Q-factor; cavity resonator filters; mechanical stability; micromechanical devices; microwave filters; silicon-on-insulator; SOI-based RF MEMS tuners; frequency 5 GHz to 1.9 GHz; high-Q tunable microwave cavity resonators; integrated electrostatically actuated thin diaphragms; loss 3.55 dB to 2.38 dB; mechanical stability measurements; microelectromechanical systems; microwave filters; quality factors; time 3 hr; tunable evanescent-mode electromagnetic cavity resonators; Electrostatic actuation; evanescent-mode cavity; microelectromechanical systems (MEMS); quality factor; tunable filter; tunable resonator; tuning;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2010.2055544
Filename :
5512545
Link To Document :
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