Title :
Over critical-current behaviour of Bi-2223 tapes [for fault current limiters]
Author :
Le Lay, L. ; Spiller, D.M. ; Belmont, O.
Author_Institution :
BICC Supercond., Wrexham, UK
fDate :
6/1/1999 12:00:00 AM
Abstract :
The authors have tested the response of Bi-2223 tapes in over-critical current conditions with a view to exploring this material´s prospects for fault current limiter applications. Silver and silver-alloy clad multifilamentary tapes have been put in series with a transformer and a resistor. Currents exceeding I/sub c/ were allowed to flow through the samples when the resistor was short-circuited. AC peak currents up to 100 I/sub c/ (about 2000 A) have thus been applied to the samples for up to 50 ms. The authors measured the samples´ resistivity and electric field as a function of the applied current. Samples had a resistivity of 0.6 /spl mu/ohmcm for peak currents up to several tens I/sub c/ and no sample degradation was observed. However, a resistivity of nearly 10 /spl mu/ohmcm was measured for peak currents over 2000 A and samples were damaged by heating effects. The electric field was 2.2 V/m for a current of 400 A. Therefore, controlling a 400 A fault current (about 20 I/sub c/) would require 0.45 km of tape for a 1 kV fault current limiter.
Keywords :
bismuth compounds; calcium compounds; copper compounds; electric field measurement; electrical resistivity; fault current limiters; high-temperature superconductors; multifilamentary superconductors; strontium compounds; superconducting devices; superconducting tapes; 0.45 km; 0.6 muohmcm; 1 kV; 10 muohmcm; 2000 A; 400 A; 50 ms; AC peak currents; Bi-2223 tapes; BiSr/sub 2/Ca/sub 2/Cu/sub 2/O/sub 3/; HTSC; applied current; electric field measurement; multifilamentary tapes; over-critical current conditions; resistivity measurement; superconducting fault current limiters; Conductivity; Current measurement; Degradation; Electric fields; Electric variables measurement; Fault current limiters; Fault currents; Materials testing; Resistors; Silver;
Journal_Title :
Applied Superconductivity, IEEE Transactions on