DocumentCode :
1541612
Title :
A Low Noise Pixel Architecture for Scientific CMOS Monolithic Active Pixel Sensors
Author :
Coath, Rebecca E. ; Crooks, Jamie P. ; Godbeer, Adam ; Wilson, Matthew D. ; Zhang, Zhige ; Stanitzki, Marcel ; Tyndel, Mike ; Turchetta, Renato A D
Author_Institution :
Sci. & Technol. Facilities Council, Rutherford Appleton Lab., Didcot, UK
Volume :
57
Issue :
5
fYear :
2010
Firstpage :
2490
Lastpage :
2496
Abstract :
This paper presents the design and characterisation of FORTIS (4T Test Image Sensor), which is a low noise, CMOS monolithic active pixel sensor for scientific applications. The pixels present in FORTIS are based around the four transistor (4T) pixel architecture, which is already widely used in the commercial imaging community. The sensor design contains thirteen different variants of the 4T pixel architecture to investigate the effects of changing its core parameters. The variants include differences in the pixel pitch, the diode size, the in-pixel source follower, and the capacitance of the floating diffusion node (the input node of the in-pixel source follower). Processing variations have also been studied, which include varying the resistivity of the epitaxial layer and investigating the effects of a special deep p-well layer. By varying these parameters, the 4T pixel architecture can be optimised for scientific applications where detection of small amounts of charge is required.
Keywords :
CMOS image sensors; epitaxial layers; 4T test image sensor; FORTIS; commercial imaging; diode size; epitaxial layer; floating diffusion node; in-pixel source follower; low noise pixel architecture; p-well layer; pixel pitch; scientific CMOS monolithic active pixel sensors; Active noise reduction; CMOS image sensors; Capacitance; Conductivity; Diodes; Epitaxial layers; Image sensors; Pixel; Sensor phenomena and characterization; Testing; 4T pixel; CMOS image sensors; active pixel sensors; high resistivity epitaxial layer; image sensors; low noise image sensor; pinned photodiode; radiation hardness; random telegraph signal noise;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2010.2052469
Filename :
5512562
Link To Document :
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