Title :
Fields at a Finite Conducting Wedge and Applications in Interconnect Modeling
Author :
Demeester, Thomas ; De Zutter, Daniël
Author_Institution :
Dept. of Inf. Technol., Ghent Univ., Ghent, Belgium
Abstract :
The fields at a finite conducting 2-D wedge are studied by means of the surface admittance operator, and compared to the case of a perfect conductor. This technique, applied to a number of numerical examples, allows a thorough investigation of the singular behavior of the fields near the edge, including nonsingular fields such as the longitudinal current distribution. Special attention is devoted to the validity of the quasi-TM approximations, when edge singularities are taken into account. The studied field properties lead to the formulation of an approximative local surface impedance for conductors, and are finally used to show how some differences in the resistive and inductive behavior of conductors with a different geometry are due to edge effects.
Keywords :
conductors (electric); current distribution; integrated circuit interconnections; approximative local surface impedance; edge effects; edge singularities; finite conducting 2D wedge; interconnect modeling; longitudinal current distribution; quasi-TM approximations; surface admittance operator; Conductivity; Conductors; Dielectric losses; Frequency; Inductance; Integrated circuit interconnections; Skin effect; Surface impedance; Surface resistance; Very large scale integration; Conductor; edge effect; finite conductivity; inductance; resistance; skin effect; surface impedance; transmission line parameters; wedge;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2010.2053061