DocumentCode :
1541831
Title :
Imaging of vortices and 1/f noise sources in YBCO dc SQUIDs using low-temperature scanning electron microscopy
Author :
Keil, S. ; Straub, R. ; Gerber, R. ; Huebener, R.P. ; Koelle, D. ; Gross, R. ; Barthel, K.
Author_Institution :
Phys. Inst., Tubingen Univ., Germany
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
2961
Lastpage :
2966
Abstract :
Abrikosov- and Josephson-Vortices trapped in bicrystalline YBa/sub 2/Cu/sub 3/O/sub 7/ washer dc SQUIDs containing regular arrays of micrometer holes (antidots) have been directly imaged using a standard scanning electron microscope equipped with a liquid nitrogen cryostage. The signal generation is based on the electron-beam-induced local displacement of vortices, which is detected as a flux change in the SQUID loop. This technique allows one a simple visualization of vortices with a spatial resolution of /spl ap/1 /spl mu/m, at variable temperature and magnetic field. The magnitude of the vortex signal is a direct measure of the amount of flux a vortex couples into the SQUID hole. In addition to the static local distribution of vortices, this technique can provide information on the dynamic behaviour of vortices trapped in the SQUID loop, by using the beam as a local perturbation and measuring the low-frequency noise induced by vortex motion.
Keywords :
1/f noise; SQUIDs; barium compounds; flux-line lattice; high-temperature superconductors; scanning electron microscopy; superconducting device noise; yttrium compounds; 1/f noise; Abrikosov vortex; Josephson vortex; LTSEM imaging; YBa/sub 2/Cu/sub 3/O/sub 7/; antidot array; bicrystalline YBa/sub 2/Cu/sub 3/O/sub 7/ washer DC SQUID; electron beam irradiation; low temperature scanning electron microscopy; Charge carrier processes; Electron traps; Magnetic field measurement; Nitrogen; SQUIDs; Scanning electron microscopy; Signal generators; Spatial resolution; Visualization; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.783651
Filename :
783651
Link To Document :
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