Title :
Effects of oxygen content on YBCO Josephson junction structures
Author :
Sydow, J.P. ; Berninger, M. ; Buhrman, R.A. ; Moeckly, B.H.
Author_Institution :
Cornell Univ., Ithaca, NY, USA
fDate :
6/1/1999 12:00:00 AM
Abstract :
The high degree of crystal stress and strain present at, and in the vicinity of, high angle grain boundary (GBJ), ramp edge Co doped SNS (Co-SNS), or interface engineered junctions (IEJ) can lead to localized and highly non-uniform regions of basal plane oxygen loss in YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (YBCO). These oxygen inhomogeneities will, to a greater or lesser degree, affect or cause the superconducting weak link behaviour demonstrated by these types of junctions. In order to examine the impact of the localized oxygen micro/nanostructure on the weak link behaviour of these three junction technologies, we have utilized ozone anneals to provide a partial pressure of atomic oxygen far in excess of that produced by standard O/sub 2/ anneals.
Keywords :
Josephson effect; annealing; barium compounds; high-temperature superconductors; stoichiometry; yttrium compounds; YBCO Josephson junction; YBa/sub 2/Cu/sub 3/O/sub 7/; crystal strain; crystal stress; grain boundary junction; interface engineered junction; oxygen content; ozone annealing; ramp edge Co doped SNS junction; superconducting weak link; Annealing; Capacitive sensors; Fabrication; Grain boundaries; Josephson junctions; Oxygen; Stress; Superconducting devices; Temperature; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on