Effects of oxygen content on YBCO Josephson junction structures

Author

Sydow, J.P. ; Berninger, M. ; Buhrman, R.A. ; Moeckly, B.H.

Author_Institution

Cornell Univ., Ithaca, NY, USA

Volume

9

Issue

2

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

2993

Lastpage

2996

Abstract

The high degree of crystal stress and strain present at, and in the vicinity of, high angle grain boundary (GBJ), ramp edge Co doped SNS (Co-SNS), or interface engineered junctions (IEJ) can lead to localized and highly non-uniform regions of basal plane oxygen loss in YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (YBCO). These oxygen inhomogeneities will, to a greater or lesser degree, affect or cause the superconducting weak link behaviour demonstrated by these types of junctions. In order to examine the impact of the localized oxygen micro/nanostructure on the weak link behaviour of these three junction technologies, we have utilized ozone anneals to provide a partial pressure of atomic oxygen far in excess of that produced by standard O/sub 2/ anneals.

Keywords

Josephson effect; annealing; barium compounds; high-temperature superconductors; stoichiometry; yttrium compounds; YBCO Josephson junction; YBa/sub 2/Cu/sub 3/O/sub 7/; crystal strain; crystal stress; grain boundary junction; interface engineered junction; oxygen content; ozone annealing; ramp edge Co doped SNS junction; superconducting weak link; Annealing; Capacitive sensors; Fabrication; Grain boundaries; Josephson junctions; Oxygen; Stress; Superconducting devices; Temperature; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.783658

Filename

783658