• DocumentCode
    1541873
  • Title

    Flux trapping and magnetic field dependence of critical currents in narrow YBCO step edge junctions

  • Author

    Mitchell, E.E. ; Foley, C.P. ; Muller, K.-H. ; Leslie, K.E. ; Tilbrook, D.L.

  • Author_Institution
    Telecommun. & Ind. Phys., CSIRO, Lindfield, NSW, Australia
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    2997
  • Lastpage
    3000
  • Abstract
    We have studied narrow (0.8-18 /spl mu/m wide) YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// step edge junctions in moderate applied magnetic fields as high as B/sub a//spl sim/25 mT. The magnetic field dependence of the junction critical current, I/sub c/, resembles a Fraunhofer diffraction pattern for all the junctions studied, although the field values of the pattern minima are modified due to the planar geometry. At 77 K these narrow junctions exhibit abrupt discontinuities in the I/sub c/(B/sub a/) pattern due to jumps in I/sub c/. These jumps are most likely due to sudden changes in the position of an individual vortex in close proximity to the junction. The I/sub c/(B/sub a/) patterns show hysteretic behaviour for applied fields B/sub a/>1-2 mT at 77 K, and the magnitude of this hysteretic behaviour appears to plateau for B/sub a/>/spl sim/12 mT, depending on junction width.
  • Keywords
    Josephson effect; barium compounds; critical currents; flux pinning; high-temperature superconductors; yttrium compounds; 1 to 25 mT; 77 K; Fraunhofer diffraction; Josephson junction; YBCO step edge junction; YBa/sub 2/Cu/sub 3/O/sub 7/; critical current; flux trapping; hysteresis; magnetic field dependence; Critical current; Diffraction; Geometry; High temperature superconductors; Josephson junctions; Magnetic field measurement; Magnetic fields; Magnetic hysteresis; Superconducting thin films; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.783659
  • Filename
    783659