Title :
Frequency following imaging of electric fields from resonant superconducting devices using a scanning near-field microwave microscope
Author :
Thanawalla, A.S. ; Feenstra, B.J. ; Weosheng Hu ; Steinhauer, D.E. ; Dutta, S.K. ; Anlage, S.M. ; Wellstood, F.C. ; Hammond, R.B.
Author_Institution :
Dept. of Phys., Maryland Univ., College Park, MD, USA
fDate :
6/1/1999 12:00:00 AM
Abstract :
We have developed a scanning near-field microwave microscope that operates at cryogenic temperatures. Our system uses an open-ended coaxial probe with a 200 /spl mu/m inner conductor diameter and operates from 77 to 300 K in the 0.01-20 GHz frequency range. In this paper, we present microwave images of the electric field distribution above a Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/ microstrip resonator at 77 K, measured at several heights. In addition, we describe the use of a frequency-following circuit to study the influence of the probe on the resonant frequency of the device.
Keywords :
barium compounds; calcium compounds; electric field measurement; high-temperature superconductors; low-temperature techniques; microstrip resonators; microwave imaging; scanning probe microscopy; superconducting device testing; superconducting resonators; thallium compounds; 0.01 to 20 GHz; 77 to 300 K; Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/; coaxial probe; cryogenic temperature; electric field distribution; frequency-following imaging; resonant frequency; scanning near-field microwave microscope; superconducting microstrip resonator; Coaxial components; Conductors; Cryogenics; Frequency; Microscopy; Microstrip resonators; Microwave imaging; Probes; Resonance; Temperature;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
